Accession Number : ADA261485


Title :   Gordon Conference on Point Defects, Line Defects and Interfaces in Semiconductors, Held in Plymouth, New Hampshire on 20-24 Jul 1992


Descriptive Note : Final program


Corporate Author : GORDON RESEARCH CONFERENCES INC KINGSTON RI


Personal Author(s) : Cruickshank, Alexander


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a261485.pdf


Report Date : 03 Dec 1992


Pagination or Media Count : 10


Abstract : By any number of measures the 1992 Gordon Research Conference on Point Defects, Line Defects and Interfaces in Semiconductors was very successful. The Gordon conference organization evaluates all of its conferences by means of a questionnaire to all participants. Our conference was ranked 20 out of 134 conferences held during the summer of 1992. This is especially good for a field that is so mature. Good choices of discussion leaders and speakers were key to this success. Speakers from related fields where new and important defect problems are emerging generated a lot of excitement. The 23 invited talks were presented in sessions run by 11 different discussion leaders. In addition 59 posters were presented. The total number of participants was about 125. In this year of reduced travel budgets, many key people would not have been able to participate without financial support. Having so many younger scientists among the participants was also important. The conference finances are summarized on the attached sheet. Since no conference proceedings or abstract book was printed, I submit the final program along with a complete list of the poster presentations as the final report.


Descriptors :   *INTERFACES , *SEMICONDUCTORS , *POINT DEFECTS , SYMPOSIA , GALLIUM ARSENIDES , SUPERLATTICES , IMPURITIES , DISLOCATIONS , ALUMINUM ARSENIDES , DEFECT ANALYSIS , SCIENTISTS , ERBIUM , QUESTIONNAIRES , SELECTION , GERMANIUM , RARE EARTH ELEMENTS , DIFFUSION , SILICON , MICROSCOPY , ABSTRACTS , STRAIN(MECHANICS) , LIGHT , STRUCTURAL ANALYSIS , ORGANIZATIONS


Subject Categories : Electrical and Electronic Equipment
      Crystallography
      Optics
      Solid State Physics


Distribution Statement : APPROVED FOR PUBLIC RELEASE