Accession Number : ADA261391


Title :   Multichip Module High Speed Testing


Descriptive Note : Quarterly progress rept. 1 Oct-31 Dec 1992


Corporate Author : COLUMBIA UNIV NEW YORK DEPT OF ELECTRICAL ENGINEERING


Personal Author(s) : Davis, Robert J ; Auston, David H


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a261391.pdf


Report Date : 31 Dec 1992


Pagination or Media Count : 3


Abstract : Work is proceeding on the testing of high-speed circuits using poled electrooptic polymers. Coplanar electrodes with thin layer (3 microns) coatings of a copolymer system. The samples were poled at their glass transition temperature of 132 deg C at a poling field of 0.50 MV/cm. The response was measured in transmission mode through the electrode gap using a Ti:sapphire laser and a lock-in amplifier.


Descriptors :   *ELECTROOPTICS , *CHIPS(ELECTRONICS) , SCATTERING , COPOLYMERS , PHOTODETECTION , GOLD , ELECTRODES , POLYMERS , GALLIUM ARSENIDES


Subject Categories : Electrooptical and Optoelectronic Devices


Distribution Statement : APPROVED FOR PUBLIC RELEASE