Accession Number : ADA258035


Title :   International Conference on Defects in Semiconductors (16th) Held in Bethlehem, Pennsylvania on 22-26 July 1991


Descriptive Note : Final rept. 1 May 1991-30 Apr 1992


Corporate Author : LEHIGH UNIV BETHLEHEM PA


Personal Author(s) : Stavola, M ; DeLeo, G


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a258035.pdf


Report Date : 30 Apr 1992


Pagination or Media Count : 329


Abstract : This report consists of the abstracts for the 16th International Conference on Defects in Semiconductors held at Lehigh University, Bethlehem, PA on July 22-26, 1991. Approximately 250 papers were presented. This meeting addressed the fundamental science of imperfection in semiconductor materials. A wide range of defects of both fundamental and technological interest that include native defects, impurities, dislocations,and defects at surfaces and interfaces in variety of semiconductor materials (Si, Ge, diamond, III-V and II- VI compounds, and related alloys) were discussed. Properties of interest included defect structures (atomic and electronic), defect introduction, reactions, motion, electrical and optical characteristics, etc. The following are a few examples of recent work that is breaking new ground in the field: (1) Oxygen in GaAs has been identify recently and has metastable characteristics. (2) After many years of effort, There has been progress in the doping of II-VI materials.


Descriptors :   *SEMICONDUCTORS , *DEFECTS(MATERIALS) , METALS , SYMPOSIA , SPECTROSCOPY , DYNAMICS , ALLOYS , HYDROGEN , OXYGEN , HYDROXYL RADICALS , METASTABLE STATE , DOPING , MOLECULAR STRUCTURE , GROUP V COMPOUNDS , GROUP IV COMPOUNDS , GROUP III COMPOUNDS , SILICON , DISLOCATIONS , ATOMIC STRUCTURE , ELECTRON ENERGY , SURFACES , IMPURITIES , LAYERS , GALLIUM ARSENIDES , SUPERLATTICES , STRAIN(MECHANICS)


Subject Categories : Physical Chemistry
      Electrical and Electronic Equipment
      Properties of Metals and Alloys
      Solid State Physics


Distribution Statement : APPROVED FOR PUBLIC RELEASE