Accession Number : ADA257712
Title : Scan-Based Switching Tests
Descriptive Note : Final technical rept.
Corporate Author : HARRIS CORP MELBOURNE FL GOVERNMENT INFORMATION SYSTEMS DIV
Personal Author(s) : Bashaw, Larry D ; Vriezen, Ted H
Report Date : Jul 1992
Pagination or Media Count : 52
Abstract : This report describes an algorithm for generating scan-based switching tests. The only design consideration required by this algorithm, besides the scan design is the capability to execute two functional clocks with a desired interval between logic scans. The algorithm generates a test vector which is scanned in to cause the source register of the delay path to toggle on the first clock, and captures a transition at the output register of the delay path on the second clock. The algorithm also identifies paths that are not testable, and identifies the points of conflict.
Descriptors : *TEST AND EVALUATION , *CLOCKS , *SWITCHING , *INTEGRATED CIRCUITS , *SWITCHING CIRCUITS , ALGORITHMS , DELAY , TRANSITIONS , TIME STUDIES , INTERVALS , LOGIC , CIRCUITS , CONFLICT , PATHS , REACTION TIME , OUTPUT
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE