Accession Number : ADA113994


Title :   Technical Reliability Studies. EOS/ESD Technology Abstracts


Corporate Author : RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY


Personal Author(s) : Kraeger, Eugene ; Grimaldi, Wayne


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a113994.pdf


Report Date : Jan 1981


Pagination or Media Count : 138


Abstract : The EOS/ESD Technology Abstracts references literature pertinent to Electrical Overstress and Electrostatic Discharge damage or degradation of electronic devices. Aspects encompass design, failure analysis, protective measures and techniques, and training programs.


Descriptors :   *ELECTRONIC EQUIPMENT , *RELIABILITY(ELECTRONICS) , *STATIC DISCHARGERS , ABSTRACTS , DAMAGE , DEGRADATION , ELECTRIC DISCHARGES , FAILURE(ELECTRONICS) , LITERATURE SURVEYS , PROTECTION , REPORTS , STRESSES


Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys


Distribution Statement : APPROVED FOR PUBLIC RELEASE