Accession Number : AD1051246

Title :   Probing Surface Electric Field Noise with a Single Ion

Descriptive Note : Technical Report

Corporate Author : Lawrence Berkely National Laboratory Berkeley United States

Personal Author(s) : Daniilidis,N ; Gerber, S ; Bolloten,G ; Ramm,M ; Ransford,A ; Ulin-Avila,E ; Talukdar,I ; Haffner,H

Full Text :

Report Date : 30 Jul 2013

Pagination or Media Count : 13

Abstract : We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.

Descriptors :   electric fields , laser cooling , measurement , aluminum oxides , surface properties , spectroscopy , printed circuits , low noise , filters , circuit boards , auger electrons , ions , fabrication , trapping (Charged particles) , quantum theory

Subject Categories : Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE