Accession Number : AD1041922

Title :   Aberration Compensation in Aplanatic Solid Immersion Lens Microscopy

Descriptive Note : Journal Article

Corporate Author : Boston University Boston United States

Personal Author(s) : Lu, Yang ; Bifano,Thomas ; Unlu,Selim ; Goldberg,Bennett

Full Text :

Report Date : 08 Nov 2013

Pagination or Media Count : 9

Abstract : The imaging quality of an aplanatic SIL microscope is shown to be significantly degraded by aberrations, especially when the samples have thicknesses that are more than a few micrometers thicker or thinner than the design thickness. Aberration due to the sample thickness error is modeled and compared with measurements obtained in a high numerical aperture (NA 3.5) microscope. A technique to recover near-ideal imaging quality by compensating aberrations using a MEMS deformable mirror is described and demonstrated.

Descriptors :   refractive index , refraction , optics , numerical aperture , ray tracing , deformable mirrors , confocal microscopy

Subject Categories : Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE