Accession Number : AD1041922


Title :   Aberration Compensation in Aplanatic Solid Immersion Lens Microscopy


Descriptive Note : Journal Article


Corporate Author : Boston University Boston United States


Personal Author(s) : Lu, Yang ; Bifano,Thomas ; Unlu,Selim ; Goldberg,Bennett


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/1041922.pdf


Report Date : 08 Nov 2013


Pagination or Media Count : 9


Abstract : The imaging quality of an aplanatic SIL microscope is shown to be significantly degraded by aberrations, especially when the samples have thicknesses that are more than a few micrometers thicker or thinner than the design thickness. Aberration due to the sample thickness error is modeled and compared with measurements obtained in a high numerical aperture (NA 3.5) microscope. A technique to recover near-ideal imaging quality by compensating aberrations using a MEMS deformable mirror is described and demonstrated.


Descriptors :   refractive index , refraction , optics , numerical aperture , ray tracing , deformable mirrors , confocal microscopy


Subject Categories : Optics


Distribution Statement : APPROVED FOR PUBLIC RELEASE