Accession Number : AD1039992


Title :   Optimization of Easy Atomic Force Microscope (ezAFM) Controls for Semiconductor Nanostructure Profiling


Descriptive Note : Technical Report,05 Jul 2017,18 Aug 2017


Corporate Author : US Army Research Laboratory Adelphi United States


Personal Author(s) : Bisoi,Satwik ; Das,Naresh


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/1039992.pdf


Report Date : 01 Sep 2017


Pagination or Media Count : 16


Abstract : The US Army Research Laboratory recently procured an Easy Atomic Force Microscope (ezAFM), from a NanoMagnetics vendor. The ezAFM can profile nanostructures on the order of 2.0 A in the vertical (z) directions. There are several instruments controls like proportional, integral, and derivative (PID) gain as well as tip force and laser power that have to be set right to get best surface profiling of semiconductor nanostructured materials. In this report, we present how to obtain good-quality profiling pictures using ezAFM by varying PID values. We used the equipment supplier-provided standard calibration samples as well as our in-house-grown nanostructure samples.


Descriptors :   calibration , nanostructures , semiconductors , optimization , nanomaterials , electrons , substrates , microscopes , scanning , image processing


Subject Categories : Optics
      Machinery and Tools


Distribution Statement : APPROVED FOR PUBLIC RELEASE