Accession Number : AD1031325

Title :   A Model for Microcontroller Functionality Upset Induced by External Pulsed Electromagnetic Irradiation

Descriptive Note : Technical Report,22 Nov 2015,21 Nov 2016

Corporate Author : XL Scientific, LLC Albuquerque United States

Personal Author(s) : Dietz,David ; Clarke,Timothy J

Full Text :

Report Date : 21 Nov 2016

Pagination or Media Count : 58

Abstract : We present a model that provides predictions for the occurrence of disruptive deviations of signal line activity in and consequent malfunction of a microcontroller (microC) subjected to external irradiation by a narrowband electromagnetic (EM) pulse. In our model, the state of a microC is completely specified by giving, for each of its relevant signal lines, the signal pulse train (SPT) time history on the line during any fixed but arbitrary time window of interest. The occurrence of such disruptive deviations is observed experimentally to behave stochastically in at least some EM pulse frequency regimes for example, in the radio frequency (RF) regime and our model provides predictions for the probability of such disruptions based upon all relevant characteristics of the EM pulse and of the microC SPTs. In the present paper we focus our attention on signals traversing a single microC signal line.

Descriptors :   electromagnetic interference , ELECTROMAGNETIC PULSES , radio frequency interference , integrated circuits , radiation effects , time intervals , digital circuits

Distribution Statement : APPROVED FOR PUBLIC RELEASE