Accession Number : AD1025465

Title :   Microelectronics Reliability

Descriptive Note : Technical Report,01 Jan 2015,31 Jan 2017

Corporate Author : Air Force Research Laboratory, Space Vehicles Directorate Kirtland AFB United States

Personal Author(s) : Mayberry,Clay ; Bernstein,Joseph

Full Text :

Report Date : 17 Jan 2017

Pagination or Media Count : 30

Abstract : In this research, an innovative and practical way to use the various physics of failure equations is shown together with accelerated testing for reliability prediction of devices exhibiting multiple failure mechanisms. Also presented was an integrated accelerating and measuring platform to be implemented inside FPGA chips, making the MTOL testing more accurate, allowing these tests at the chip and perhaps at the system level, rather than only at the transistor level. The calibration of physics models with highly accelerated testing of complete commercial devices allows for actual reliability prediction. The MTOL Matrix can provide information about the proportional effect of each failure mechanism; allowing extrapolation of the expected reliability of the device under various conditions.

Descriptors :   life tests , Failure , semiconductor devices , Microelectronics , field programmable gate arrays

Subject Categories : Test Facilities, Equipment and Methods
      Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE