Accession Number : AD0848789


Title :   Tube Failure Mechanisms.


Descriptive Note : Quarterly rept. no. 3, 1 Nov 68-31 Jan 69,


Corporate Author : RAYTHEON CO WALTHAM MA MICROWAVE AND POWER TUBE DIV


Personal Author(s) : Bouchard, Kenneth G. ; Weihrauch, Paul


Report Date : 07 FEB 1969


Pagination or Media Count : 22


Abstract : The purpose of this program is to investigate the nature and the principal causes of failures in microwave tubes. In this context, the following studies will be made: (a) An investigation of the factors influencing electrical breakdown in a vacuum and across the surface of a dielectric. (b) An investigation of the various electrical and surface properties of materials commonly used in microwave tubes, i.e., OFHC copper, alumina ceramic, tungsten thoria cermets, tungsten matrix, and others; in addition, less frequently used materials will be investigated, such as boron nitride and dispersion-strengthened copper. (c) Surface diffusion and other surface physics phenomena. (Author)


Descriptors :   , (*ELECTRON TUBES, RELIABILITY(ELECTRONICS)), CATHODES(ELECTRON TUBES), COPPER, SURFACE PROPERTIES, ELECTRIC DISCHARGES, EMISSIVITY, SECONDARY EMISSION, STATIC ELECTRICITY, DEGRADATION, FAILURE(ELECTRONICS).


Subject Categories : ELECTRICAL AND ELECTRONIC EQUIPMENT


Distribution Statement : APPROVED FOR PUBLIC RELEASE