Accession Number : AD0477693
Title : STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE).
Descriptive Note : Annual interim rept. no. 1, 15 Jun 64-14 Jun 65,
Corporate Author : IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER
Personal Author(s) : Frankovsky, Frank A. ; Shatzkes, Morris
Report Date : JAN 1966
Pagination or Media Count : 98
Abstract : The effects of reactor radiation and LINAC irradiation on the dielectric properties of several common capacitors are compared. The dependence of the induced currents generated on applied voltage, geometry, dose, and dose-rate, is contrasted for mylar, polystyrene, mica, tantalum, glass, and ceramic capacitors. These effects are analyzed in terms of models appropriate for the various capacitors and their associated parameters are defined. Induced currents in irradiated thin-film resistors are principally due to secondary emission and air ionization. Static tests of ferrite core memory planes and magnetic tape were conducted at LINAC. The purpose was to determine whether these materials would retain stored information after radiation exposure. (Author)
Descriptors : *RADIATION EFFECTS), (*ELECTRONIC EQUIPMENT, (*CAPACITORS, RADIATION EFFECTS), (*MEMORY DEVICES, RADIATION EFFECTS), DIELECTRIC PROPERTIES, GLASS CAPACITORS, CERAMIC CAPACITORS, TANTALUM CAPACITORS, MICA CAPACITORS, STYRENE PLASTICS, RESISTORS, POLYESTER PLASTICS, MAGNETIC TAPE, MAGNETIC CORES, THIN FILM STORAGE DEVICES, GAMMA RAYS, NEUTRONS.
Subject Categories : ELECTRICAL AND ELECTRONIC EQUIPMENT
Distribution Statement : APPROVED FOR PUBLIC RELEASE