Accession Number : AD0476301


Title :   ACCELERATED TEST PROGRAM - VOLUME I.


Descriptive Note : Final technical documentary rept. 10 Jun 64-10 Jun 65,


Corporate Author : GENERAL ELECTRIC CO PHILADELPHIA PA MISSILE AND SPACE DIV


Personal Author(s) : Walsh, T M ; Endicott, H S ; Best, G ; McLean, H


Report Date : 10 Jul 1965


Pagination or Media Count : 394


Abstract : A review of data and information gathered during previously conducted accelerated test programs has led to the formulation of degradation models for the parts under study. Long term constant stress tests, which were inactive for a 10 month period after accumulating 5000 to 9000 hours of test time at various stress conditions, were restarted and accumulated an additional 8000 hours. An accelerated test design and analysis plan was formulated which is applicable to all electronic parts which exhibit chemical degradation. Failure Mechanism Studies led to the formulation of a current conduction model and breakdown model for glass dielectric capacitors. (Author)


Descriptors :   *ELECTRONIC EQUIPMENT , *ACCELERATED TESTING , DEGRADATION , GLASS CAPACITORS , RESISTORS , TRANSISTORS , SEMICONDUCTOR DIODES , AGING(MATERIALS) , FIXED CAPACITORS , FAILURE(ELECTRONICS) , ARTIFICIAL SATELLITES , MATHEMATICAL MODELS , TEMPERATURE , VOLTAGE , STATISTICAL ANALYSIS , STATISTICAL DISTRIBUTIONS , SILICON ALLOYS


Subject Categories : Electrical and Electronic Equipment
      Test Facilities, Equipment and Methods


Distribution Statement : APPROVED FOR PUBLIC RELEASE