Accession Number : AD0472738


Title :   PREINDICATIONS OF FAILURE IN ELECTRONIC COMPONENTS,


Corporate Author : BATTELLE MEMORIAL INST COLUMBUS OHIO


Personal Author(s) : Klapheke ,J W ; Spradlin ,B C ; Easterday,J L


Report Date : 31 Jul 1965


Pagination or Media Count : 58


Abstract : This report discusses state-of-the-art information and techniques concerned with indications of potential degradation and catastrophic failure in electronic components. The objective of this survey is to present a comprehensive description of past, present, and future planned work on preindicators of failure for certain electronic components. This study is intended to provide basic information for future development in automatic checkout equipment. The following electronic parts were covered in the survey: semiconductors (transistors, diodes, and microcircuits), resistors, capacitors, inductors, computer cores, other items used in a computer, and vacuum tubes. Such items as wire, insulation, lamps, relays, and rotary devices were not considered. Precursors of failure have been investigated for electronic components but few have been identified at the present time. Most of these investigations were undertaken as part of programs directed at physics of failure, screening, or accelerated testing. The results of this study show that predictors of failure for semiconductors (transistors, diodes, and microcircuits) have received more attention than other types of parts. Current noise (l/f noise) and infrared emission profiles show promise as precursors that would apply to all types of semiconductors. Apparently computer cores and inductors are the least considered. (Author)


Descriptors :   FAILURE , TRANSISTORS , TUNNEL DIODES , RESISTORS , CAPACITORS , COILS , ELECTRONS


Distribution Statement : APPROVED FOR PUBLIC RELEASE