Accession Number : AD0464309


Title :   A Survey of Transient Radiation-Effect Studies on Microelectronics


Descriptive Note : Final rept. Jan-Apr 1965


Corporate Author : BOEING AEROSPACE CO SEATTLE WA


Personal Author(s) : Bowman, William C ; Caldwell, Robert S ; Svetich, G W


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/464309.pdf


Report Date : May 1965


Pagination or Media Count : 127


Abstract : In order to obtain complete up-to-date knowledge of the work accomplished and presently being done on the effects of transient nuclear radiation on microelectronics, a survey of the laboratories investigating this subject was conducted. Telephone contacts were made with specific individuals in 53 different laboratories. Data were obtained by means of questionnaires, reports, and personal visits. Abstracts of each document or other data source are included in the report. The abstracts describe the devices tested and the test environment, the type of dosimetry used, the general results obtained, and provide other relevant information. Summaries of failure levels are given in the abstracts whenever the information was readily available. A tabulated summary of the devices tested and the test conditions is presented. Failure levels observed by different investigators are compared for a few duplicated devices. Nine classified abstracts are contained in a supplement to the main report.


Descriptors :   *MICROELECTRONICS , *RADIATION EFFECTS , TRANSIENTS , DAMAGE , BIBLIOGRAPHIES , ELECTRONIC EQUIPMENT , INTEGRATED CIRCUITS


Subject Categories : Radiobiology
      Electrical and Electronic Equipment


Distribution Statement : APPROVED FOR PUBLIC RELEASE