Accession Number : AD0437946


Title :   PRODUCTION ENGINEERING MEASURE. PRODUCTION DEVELOPMENT OF A SILICON PLANAR EPITAXIAL TRANSISTOR WITH A MAXIMUM OPERATING FAILURE RATE OE 0.001% PER 1000 HOURS AT A CONFIDENCE LEVEL OF 90% AT 25C.


Descriptive Note : Quarterly rept. no. 6, 1 Aug-31 Oct 63,


Corporate Author : MOTOROLA INC PHOENIX ARIZ


Personal Author(s) : Greer,Paul H


Report Date : 31 Oct 1963


Pagination or Media Count : 47


Abstract : This report contains the results of e,forts expended in the Reliability Engineering area during the sixth (and final) quarter of the reliability improvement program. Final large scale tests of Al-Al-Au metallization process devices are described and the results compared with previous test results. Parameter distributions and stability during operating and storage life test are discussed as well as comparative failure rates and mechanical ruggedness. An estimate of the failure rate achieved on this program for the Motorola 2N2219 is presented. (Author)


Descriptors :   *TRANSISTORS , TRANSISTORS , SILICON , MANUFACTURING , EPITAXIAL GROWTH , ACCELERATION , RELIABILITY(ELECTRONICS) , DISTRIBUTION , STORAGE , LIFE EXPECTANCY(SERVICE LIFE) , FAILURE(MECHANICS) , TEST METHODS , STABILITY , ALUMINUM ALLOYS , GOLD ALLOYS , ENVIRONMENTAL TESTS , PROBABILITY


Distribution Statement : APPROVED FOR PUBLIC RELEASE