Accession Number : AD0437692


Title :   SEMICONDUCTOR RELIABILITY.


Descriptive Note : Final rept.,


Corporate Author : ARINC RESEARCH CORP WASHINGTON DC


Personal Author(s) : Blakemore, George J ; Kronson, Edward T ; Von Alven, William H


Report Date : 31 Jul 1963


Pagination or Media Count : 1


Abstract : The main objectives of the program were to determine quality assurance requirements for specific semiconductor devices, and to determine confidence limits for the shape parameter Beta of the Weibull distribution. A summation of the main findings of the research program is given. Of particular interest is the finding that integral circuits used in digital applications are potentially as reliable as a single discrete transistor used in digital applications. Another finding of significance is that the distribution of field removal rates for diodes in regulator and rectifier applications is approximately the same as the distribution of field removal rates for transistors used in amplifier or high-power applications. On the average, the removal rates for devices in analog (amplifier) applications are approximately 300 times higher than the rates for devices in digital applications. (Author)


Descriptors :   RELIABILITY(ELECTRONICS) , LIFE EXPECTANCY(SERVICE LIFE) , MONTE CARLO METHOD , TABLES(DATA) , SEMICONDUCTOR DIODES , TRANSISTORS , CRYSTAL RECTIFIERS , TUNNEL DIODES , LEAST SQUARES METHOD , STATISTICAL ANALYSIS , DISTRIBUTION THEORY


Distribution Statement : APPROVED FOR PUBLIC RELEASE