Accession Number : AD0437351


Title :   QUARTZ CRYSTAL UNIT TEST SET AN/TSM-20(), 2.5 KC TO 1100 KC,


Corporate Author : ARMY ELECTRONICS LABS FORT MONMOUTH N J


Personal Author(s) : Bowerman,Walter H ; Pochmerski,Dennis


Report Date : Aug 1963


Pagination or Media Count : 19


Abstract : Evaluation of Quartz Crystal Unit Test Set AN/TSM20() is described. The outstanding characteristic of the AN/TSM-20() is its improved drive/resistance compared to that of the Quartz Crystal Unit Test Set TS-+=)/TSM. A means of modifying the TS-710/TSM is described which will make it essentially identical to the AN/TSM-20() except for the extended frequency range of the latter. (Author)


Descriptors :   *TEST SETS , QUARTZ , TEST EQUIPMENT , ELECTRONIC EQUIPMENT , RADIOFREQUENCY , ELECTRICAL RESISTANCE , CIRCUITS , VERY LOW FREQUENCY , LOW FREQUENCY , MEDIUM FREQUENCY


Distribution Statement : APPROVED FOR PUBLIC RELEASE