Accession Number : AD0435565


Title :   PRODUCTION ENGINEERING MEASURE RELIABILITY IMPROVEMENT JET ETCH TRANSISTOR.


Descriptive Note : Quarterly rept. no. 6, 31 July-31 Oct 63,


Corporate Author : SPRAGUE ELECTRIC CO NORTH ADAMS MASS


Personal Author(s) : Edwards ,J N ; Folster ,J H D ; Gagne ,R M ; Ritterbush,L F


Report Date : Oct 1963


Pagination or Media Count : 14


Abstract : It was found that the V subCE method of monitoring delineation was not completely adaptable to production. A new approach was therefore devised, and this approach, which utilizes the value of I sub cbo and shape of the breakdown curve, is described. The problem which led to a temporary increase in failure rate was solved. Data which confirm this solution and which also show the effect to centrifuging the transistors are presented. (Author)


Descriptors :   *TRANSISTORS , MANUFACTURING , PRODUCTION , ETCHED CRYSTALS , CHEMICAL MILLING , VOLTAGE , ELECTRIC CURRENT , ELECTRODES , RELIABILITY(ELECTRONICS) , EMBEDDING SUBSTANCES


Distribution Statement : APPROVED FOR PUBLIC RELEASE