Accession Number : AD0435564


Title :   PRODUCTION ENGINEERING MEASURE RELIABILITY IMPROVEMENT JET ETCH TRANSISTOR.


Descriptive Note : Quarterly rept. no. 5, 30 Apr-31 July 63,


Corporate Author : SPRAGUE ELECTRIC CO NORTH ADAMS MASS


Personal Author(s) : Edwards ,J N ; Folster ,J H D ; Gagne ,R M ; Ritterbush,L F


Report Date : Jul 1963


Pagination or Media Count : 16


Abstract : Further work on methods of monitoring collector delineation revealed that the V subCE method is the most satisfactory. Consequently, this method will replace the V subCB method formerly in use. The new method is now being evaluated in production. An increase in failure rate occurred during this period. Through exhaustive investigation, the problem was traced to improper application of the special coating and potting compound. Remedial action was taken, and the problem appears solved, as indicated by latest testing results presented in this report. (Author)


Descriptors :   *TRANSISTORS , MANUFACTURING , PRODUCTION , CHEMICAL MILLING , ETCHED CRYSTALS , ELECTRODES , VOLTAGE , RELIABILITY(ELECTRONICS) , LIFE EXPECTANCY(SERVICE LIFE) , COATINGS , EMBEDDING SUBSTANCES


Distribution Statement : APPROVED FOR PUBLIC RELEASE