Accession Number : AD0434329


Title :   PHYSICS OF FAILURE IN ELECTRONICS. VOLUME 2,


Corporate Author : IIT RESEARCH INST CHICAGO ILL


Personal Author(s) : Goldberg,M F ; Vaccaro,Joseph


Report Date : 06 Mar 1964


Pagination or Media Count : 271


Descriptors :   *FAILURE(MECHANICS) , *RELIABILITY(ELECTRONICS) , FAILURE(MECHANICS) , SYMPOSIA , RESISTORS , AGING(MATERIALS) , CAPACITORS , MATHEMATICAL PREDICTION , TRANSISTORS , STRESSES , SEMICONDUCTOR DIODES , NOISE(RADIO) , SILICON , GERMANIUM , TRAVELING WAVE TUBES , MASERS , MINIATURE ELECTRONIC EQUIPMENT , TUNNEL DIODES


Distribution Statement : APPROVED FOR PUBLIC RELEASE