Accession Number : AD0431765


Title :   COMPUTER PROGRAMS FOR THE ANALYSIS OF POSITIONS AND PROFILES OF X-RAY POWDER PATTERNS,


Corporate Author : YALE UNIV NEW HAVEN CONN HAMMOND LAB


Personal Author(s) : Aqua,E N


Report Date : Oct 1963


Pagination or Media Count : 19


Abstract : Computer programs have been written for the analysis of x-ray diffraction powder pattern peaks. The K-alpha sub 1 component peak is resolved by the Rachinger method. The observed peak intensities are corrected for background level counts, scattering factor and Lorentz Polarization factor before the calculations of the total diffracted intensity, the center of gravity and the variance of the peak, and the position of peak maximum are made. A Fourier analysis of the peak profile is performed, and the instrumental broadening is eliminated by the analytical method of Stokes. (Author)


Descriptors :   *COMPUTER PROGRAMMING , X RAY DIFFRACTION , POWDERS , REFRACTOMETERS , INPUT OUTPUT DEVICES , FOURIER ANALYSIS , DIFFRACTION , CAMERAS , GEOMETRY , INTENSITY , LINE SPECTRA


Distribution Statement : APPROVED FOR PUBLIC RELEASE