Accession Number : AD0429358


Title :   TRANSIENT RADIATION EFFECTS ON ELECTRONICS.


Descriptive Note : Interim rept.,


Corporate Author : NAVAL ORDNANCE LAB CORONA CALIF


Personal Author(s) : Hill,J L


Report Date : 01 Jan 1964


Pagination or Media Count : 14


Abstract : Certain missile electronic circuits using Shockley diodes, silicon-controlled switches, and silicon-controlled rectifiers were irradiated to determine the threshold dose rates for transient effects and to evaluate hardening techniques. This effort has resulted in the design of firing circuits that cannot be initiated by available test levels of gamma radiation. (Author)


Descriptors :   *SEMICONDUCTOR DIODES , DAMAGE , FIRING CIRCUITS , ELECTRONIC SWITCHES , CRYSTAL RECTIFIERS , DOSE RATE , HARDENING , GAMMA RAYS , TEST METHODS


Distribution Statement : APPROVED FOR PUBLIC RELEASE