Accession Number : AD0428434


Title :   RECOMBINATION AND ATTACHMENT IN IONIZED GASES,


Corporate Author : GENERAL DYNAMICS SAN DIEGO CALIF GENERAL ATOMIC DIV


Personal Author(s) : VAN Lint,V A J ; Parez,J ; Wyatt,M E ; Nichols,D K


Report Date : Dec 1963


Pagination or Media Count : 196


Abstract : Experiments were performed to measure the coefficients for electron attachment, electron-ion recombination, electron-molecule collisions, and ion-ion recombination in important atmospheric gases and atmospheric impurities. These experiments were performed by observing the rate of disappearance of electrons (or ions) in the afterglow of a pulse of ionization produced by high energy electrons transversing the gas sample. Most of the diagnostic measurements were performed by observing the phase shift and attenuation of an X-band microwave propagated through the ionized gas. Some experiments were performed with a 300 Mc resonating cavity which is sensitive enough to detect the effect of ions in the afterglow after the electrons have been attached. (Author)


Descriptors :   *GAS IONIZATION , *MICROWAVES , RECOMBINATION REACTIONS , X BAND , GASES , ATTENUATION , PROPAGATION , CAVITY RESONATORS , OXYGEN , NITROGEN , HELIUM , NEON , ARGON , COMPUTER PROGRAMMING , PLASMAS(PHYSICS) , DIFFUSION


Distribution Statement : APPROVED FOR PUBLIC RELEASE