Accession Number : AD0426698


Title :   FIELD ION MICROSCOPY OF IRON WHISKERS.


Descriptive Note : Final rept., 1 June 62-30 June 63,


Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK


Personal Author(s) : Muller,Erwin W ; Nishikawa,Osamu


Report Date : Nov 1963


Pagination or Media Count : 21


Abstract : Field ion microscopy of non-refractory metals was improved by the use of neon and neon-helium gas mixtures. A limited number of iron whiskers was observed and found to contain a high density of lattice defects, such as impurity atoms, single dislocations, and dense dislocation areas of an almost amorphous structure, particularly in the 111 region. The latter defect is an artifact caused by the stress of the evaporation field. Further progress will depend upon a reduction of this field, and the use of an image intensifier. (Author)


Descriptors :   IRON , NEON , HELIUM , CRYSTAL DEFECTS , IMPURITIES , EVAPORATION , WIRE


Distribution Statement : APPROVED FOR PUBLIC RELEASE