Accession Number : AD0148239


Title :   OXYGEN IMPURITY IN SILICON SINGLE CRYSTALS


Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE LAB FOR INSULATION RESEARCH


Personal Author(s) : SMAKULA, A. ; KALNAJS, J.


Report Date : NOV 1957


Pagination or Media Count : 1


Descriptors :   *SILICON, ANALYSIS, DETECTION, IMPURITIES, INFRARED SPECTROSCOPY, OXYGEN, SINGLE CRYSTALS, SPECTROGRAPHIC ANALYSIS.


Distribution Statement : APPROVED FOR PUBLIC RELEASE