Accession Number : AD0056364


Title :   PRECISION DETERMINATION OF LATTICE CONSTANTS WITH A GEIGER-COUNTER X-RAY DIFFRACTOMETER


Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE LAB FOR INSULATION RESEARCH


Personal Author(s) : SMAKULA, A. ; KALNAJS, J.


Report Date : FEB 1955


Pagination or Media Count : 1


Descriptors :   *NUCLEAR RADIATION SPECTROMETERS, *SINGLE CRYSTALS, *X RAY DIFFRACTION, CRYSTAL LATTICES, GEIGER COUNTERS, GONIOMETERS.


Distribution Statement : APPROVED FOR PUBLIC RELEASE