Accession Number : AD0014705


Title :   DIFFRACTION OF LONG WAVELENGTH X-RAYS


Corporate Author : CALIFORNIA INST OF TECH PASADENA NORMAN BRIDGE LAB OF PHYSICS


Personal Author(s) : HENKE, BURTON


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/014705.pdf


Report Date : Jun 1953


Pagination or Media Count : 109


Abstract : The theory and application are discussed for low angle x-ray diffraction by long wave lengths. The discussion of long-wave diffraction theory includes: the Guinier diffraction theory, mass-scattering and absorption coefficients, multiple scattering and refraction, and packing effects. Four methods are described for obtaining the diffraction pattern: (1) the double- crystal spectrometer; (2) annular slit system; (3) concave mica point-focusing monochromatic; and (4) total-reflection point-focusing system. The design and construction of the latter are described in detail. The method was applied to the measurement of Dow latex particles with 13.3 A AU x-radiation. A diameter of 2760 A was obtained.


Descriptors :   *LONG WAVELENGTHS , *X RAY DIFFRACTION , PARTICLES , DIFFRACTION , LOW ANGLES , PACKAGING , REFRACTION , ABSORPTION COEFFICIENTS , LATEX , THEORY , MEASUREMENT , PATTERNS


Subject Categories : Atomic and Molecular Physics and Spectroscopy
      Optics
      Nuclear Physics & Elementary Particle Physics


Distribution Statement : APPROVED FOR PUBLIC RELEASE